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Application Note: Raman Mapping of Layer Number, Strain, and Structural Defects in Graphene

In this Application Note, the capability of the RM5 and Ramacle® software for graphene analysis is demonstrated by mapping the layer number, strain, and defects on graphene films.

Transient Absorption and Singlet Oxygen Phosphorescence of Rose Bengal Photosensitiser

This application note shows how to characterise the triplet state of a common photosensitiser, rose bengal, as well as singlet oxygen phosphorescence using the same instrument, the LP980 Transient Absorption Spectrometer.

Application Note: Angle-Resolved Polarised Raman Microscopy for Determining the Orientation of Carbon Nanotubes

This Application Note demonstrates how the alignment of carbon nanotube architectures can be probed using angle-polarised Raman microscopy with the Edinburgh Instruments RM5

Application Note: Raman Microscopy for Pharmaceutical Analysis

This application note, Raman Microscopy for Pharmaceutical Analysis, gives a complete overview of the pharmaceutical applications of the RM5 and RMS1000 Confocal Raman Microscopes.

Application Note: Discrimination of Bacteria Species Using Raman Microscopy and Principal Component Analysis

In this Application Note, Raman spectroscopy is coupled with principal component analysis (PCA) to discriminate between bacterial species.

Application Note: Raman Microscopy for the Characterisation of Antihistamine Formulations

This application note demonstrates the benefits of Raman microscopy in pharmaceutical analysis and the role it can perform in assuring the quality and reliability of antihistamine medications.

Application Note: NIR Emission Spectra of PbS Quantum Dots Using the FS5 Spectrofluorometer

This application note the near-infrared (NIR) detection capabilities of the FS5 are employed to examine quantum dots (QDs). Solvent choice in this region can interfere with emission of the sample.

Application Note: Raman Imaging of Strain in a Silicon Semiconductor Wafer

In this Application Note, peak position and peak width Raman imaging are used to reveal strained and nanocrystalline silicon regions around a defect in a semiconductor wafer.

Application Note: Characterisation of NIR PbS Quantum Dots Using the FLS1000 Photoluminescence Spectrometer

Using the FLS1000 Photoluminescence Spectrometer, this application note evaluates the photoluminescence lifetime, quantum yield, and spectral characteristics of quantum dots (QDs) in the near-infrared (NIR) region. 

Application Note: Raman Spectroscopy for Artwork and Archaeology  

Raman spectroscopy is ideal for the identification of materials in cultural heritage artefacts because it is non-destructive, specific, sensitive, requires minimal sample preparation, and can be coupled with a microscope for micron-range spatial resolution. Our Application Note demonstrates this with various cultural heritage samples.