avril 17, 2024
Here, the IR5 FTIR Spectrometer is used to demonstrate the versatility and practicality of FTIR spectroscopy in the field of food science and technology. Specifically, when combined with a heated Attenuated Total Reflectance (ATR) accessory it highlights the instrument's capability to analyse complex lipid such as butter.
mars 12, 2024
This application note shows how to assess olive oil quality and quantify adulterants using the DS5 UV-Vis Spectrophotometer.
mars 12, 2024
This Application Note highlights how the FLS1000 Photoluminescence Spectrometer can be optimised for spectral and lifetime measurements in the NIR/MIR spectral region for measuring an Er-based fluoride glass using a 980 nm laser diode and a MIR InAs-3100 detector.
février 20, 2024
In this Application Note, the capability of the RM5 and Ramacle® software for graphene analysis is demonstrated by mapping the layer number, strain, and defects on graphene films.
février 16, 2024
This application note shows how to characterise the triplet state of a common photosensitiser, rose bengal, as well as singlet oxygen phosphorescence using the same instrument, the LP980 Transient Absorption Spectrometer.
janvier 31, 2024
This Application Note demonstrates how the alignment of carbon nanotube architectures can be probed using angle-polarised Raman microscopy with the Edinburgh Instruments RM5
janvier 22, 2024
This application note, Raman Microscopy for Pharmaceutical Analysis, gives a complete overview of the pharmaceutical applications of the RM5 and RMS1000 Confocal Raman Microscopes.
janvier 16, 2024
In this Application Note, Raman spectroscopy is coupled with principal component analysis (PCA) to discriminate between bacterial species.
décembre 11, 2023
This application note the near-infrared (NIR) detection capabilities of the FS5 are employed to examine quantum dots (QDs). Solvent choice in this region can interfere with emission of the sample.
décembre 7, 2023
In this Application Note, peak position and peak width Raman imaging are used to reveal strained and nanocrystalline silicon regions around a defect in a semiconductor wafer.