Film thickness measurement systems that can measure from 5 nm to 200 µm for analysis of single layer and/or multilayer films in less than a second in a non-contact manner.
Edinburgh Instruments Ltd. 2 Bain Square, Kirkton Campus, Livingston, EH54 7DQ
Registered in England and Wales No: 962331. VAT No: GB 271 7379 37
Edinburgh Instruments is ISO 9001 Registered
Queen’s Award for Enterprise: International Trade 2012
Created by The Lane Agency
A TechComp Company