Front Face Sample Holder
The front face sample holder has external adjustment for accurate sample positioning. The accessory comes with inserts for demountable cuvette film/slide clamp and holder for microsamples.
Options include:
Demountable sample clamp for front face measurement of powders.
Demountable sample clamp for thin films and slides.
Other Holder Options Include:
Front Face Sample Holder on Rotational Stage
Single position front face sample holder on rotational stage. The sample holder has been designed to study emission phenomena that depend on the angle of the sample orientation in respect to the emission or excitation path. Sample angle adjustable from outside the sample chamber. This sample holder is suitable for measuring front face emission on strongly absorbing samples in cuvettes. Two inserts are supplied, suitable for measurements of powders and film/slide samples.
Front Face Sample Clamp on a Rotational Stage
Single position front face sample clamp holder on rotational stage. The sample holder has been designed to study emission phenomena that depend on the angle of the sample orientation in respect to the emission or excitation path. Sample angle adjustable from outside the sample chamber. This sample holder is suitable for measuring front face emission on films or slides up to a thickness of 5 mm.
Front Face Sample Holder on XY Stage
Single position front face sample holder on XY stage. This sample holder is designed for film/slide samples that consist of a “grid” of individual samples, or for testing a sample’s homogeneity. X and Y position adjustable from outside sample chamber. This sample holder is suitable for measuring front face emission of cuvettes and films/slides.
Sample holder for powder samples (vertical excitation/emission)
Sample holder with removable powder tray and plane beam steering mirror. The mirror directs the excitation light quasi vertically onto the sample while the emission is collected and directed to the emission beam path using the same mirror. This assembly requires the mirror option in the sample chamber.
Product Description
The front face sample holder has external adjustment for accurate sample positioning. The accessory comes with inserts for demountable cuvette film/slide clamp and holder for microsamples.
Options include:
Demountable sample clamp for front face measurement of powders.
Demountable sample clamp for thin films and slides.
Other Holder Options Include:
Front Face Sample Holder on Rotational Stage
Single position front face sample holder on rotational stage. The sample holder has been designed to study emission phenomena that depend on the angle of the sample orientation in respect to the emission or excitation path. Sample angle adjustable from outside the sample chamber. This sample holder is suitable for measuring front face emission on strongly absorbing samples in cuvettes. Two inserts are supplied, suitable for measurements of powders and film/slide samples.
Front Face Sample Clamp on a Rotational Stage
Single position front face sample clamp holder on rotational stage. The sample holder has been designed to study emission phenomena that depend on the angle of the sample orientation in respect to the emission or excitation path. Sample angle adjustable from outside the sample chamber. This sample holder is suitable for measuring front face emission on films or slides up to a thickness of 5 mm.
Front Face Sample Holder on XY Stage
Single position front face sample holder on XY stage. This sample holder is designed for film/slide samples that consist of a “grid” of individual samples, or for testing a sample’s homogeneity. X and Y position adjustable from outside sample chamber. This sample holder is suitable for measuring front face emission of cuvettes and films/slides.
Sample holder for powder samples (vertical excitation/emission)
Sample holder with removable powder tray and plane beam steering mirror. The mirror directs the excitation light quasi vertically onto the sample while the emission is collected and directed to the emission beam path using the same mirror. This assembly requires the mirror option in the sample chamber.